The calculation of transmission and resonance properties of quantum devices using methods from chemical reactive scattering

Superlattices and Microstructures

Volumn 20, Issue 1, 1996, Pages 87-104

  Ravuri, T R ^a   Mandelshtam, V A ^a   Taylor, H S ^a  

^a UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRON RESONANCE; ELECTRON SCATTERING; ELECTRON TRANSPORT PROPERTIES; FERMI LEVEL; ITERATIVE METHODS; MATHEMATICAL MODELS; MATRIX ALGEBRA; SET THEORY;

CHEBYSHEV RECURSION; CHEMICAL REACTIVE SCATTERING; SPECTRAL PROJECTION METHOD; STABILIZATION METHOD;

SEMICONDUCTOR DEVICES;

EID: 0029716623     PISSN: 07496036     EISSN: None     Source Type: Journal    
DOI: 10.1006/spmi.1996.0053     Document Type: Article

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