3-D low-coherence imaging for multiple-layer industrial surface analysis

Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

Volumn , Issue , 1996, Pages 328-

  Seeger, Mauritius ^a   Podoleanu, Adrian ^a   Solomon, Chris J ^a   Jackson, David A ^a  

^a UNIVERSITY OF KENT   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CAMERAS; COHERENT LIGHT; DEMODULATION; INTERFEROMETRY; LIGHT EMITTING DIODES; MIRRORS; OPTICAL MULTILAYERS; PHASE MODULATION; SOLAR CELLS; TELESCOPES; THREE DIMENSIONAL;

CCD CAMERA; FRAME GRABBER; HUBBLE SPACE TELESCOPE; INDUSTRIAL SURFACE ANALYSIS; MICHELSON INTERFEROMETERS; NUMERICAL PROCESSING;

IMAGING TECHNIQUES;

EID: 0029716367     PISSN: 10928081     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (1)