Quarter-micron SIMOX-CMOS LVTTL-compatible gate array with an over 2,000 V ESD-protection circuit

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 1996, Pages 57-60

  Ohtomo, Yusuke ^a   Mizusawa, Takeshi ^a   Nishimura, Kazuyoshi ^a   Sawada, Hirotoshi ^a   Ino, Masayuki ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIODES; ELECTRIC BREAKDOWN; ELECTRIC CURRENTS; ELECTRIC WIRING; INTEGRATED CIRCUIT TESTING; LOGIC GATES; MOS DEVICES; SEMICONDUCTING FILMS; SEMICONDUCTING SILICON;

GATE VOLTAGE; SILICON FILMS; THRESHOLD VOLTAGE; VOLTAGE GENERATOR;

CMOS INTEGRATED CIRCUITS;

EID: 0029715157     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)