Quick address detection of an anomalous memory cell for flash EEPROM

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 1996, Pages 195-199

  Himeno, Toshihiko ^a   Hazama, Hiroaka ^a   Sakui, Koji ^a  

^a TOSHIBA CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENT MEASUREMENT; PROM; RELIABILITY; TRANSISTORS; VOLTAGE DISTRIBUTION MEASUREMENT;

ADDRESS DETECTION; FLASH EEPROM; MEASUREMENT CYCLES; MEMORY CELL; MULTI ADDRESS SELECTION SCHEME; THRESHOLD VOLTAGE;

CELLULAR ARRAYS;

EID: 0029715155     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)