Semiconductor superlattices studied by grazing x-ray scattering and diffraction

Materials Research Society Symposium - Proceedings

Volumn 417, Issue , 1996, Pages 325-330

  Ming, Z H ^a   Soo, Y L ^a   Huang, S ^a   Kao, Y H ^a   Stair, K ^a   Devane, G ^a   Choi Feng, C ^a   Chang, T ^a   Fu, L P ^a   Gilliland, G D ^a   Klem, J ^a   Hafich, M ^a  

^a UNIVERSITY AT BUFFALO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; INTERFACES (MATERIALS); MOLECULAR BEAM EPITAXY; SEMICONDUCTING FILMS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM COMPOUNDS; X RAY DIFFRACTION;

GRAZING INCIDENCE X RAY SCATTERING; LATERAL STRUCTURAL ORDERING; PERIODIC THICKNESS MODULATION;

SEMICONDUCTOR SUPERLATTICES;

EID: 0029715152     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)