Dynamic test compaction for synchronous sequential circuits using static compaction techniques

Proceedings - Annual International Conference on Fault-Tolerant Computing

Volumn , Issue , 1996, Pages 53-61

  Pomeranz, Irith ^a   Reddy, Sudhakar M ^a  

^a UNIVERSITY OF IOWA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; FAULT TOLERANT COMPUTER SYSTEMS; HEURISTIC METHODS; INTEGRATED CIRCUIT TESTING; LOCAL AREA NETWORKS; VECTORS;

DYNAMIC COMPACTION HEURISTICS; SYNCHRONOUS SEQUENTIAL CIRCUITS; TEST SEQUENCES;

SEQUENTIAL CIRCUITS;

EID: 0029715106     PISSN: 07313071     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)