High-power high-T0 native oxide stripe-geometry 980-nm laser diodes

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2682, Issue , 1996, Pages 11-19

  Burkhard, Herbert ^a   Piataev, Valery ^a   Schlapp, Winfried ^a  

^a DEUTSCHE TELEKOM LABORATORIES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

LASER DIODES; MULTIMODE LASERS; OPTICAL DAMAGE; SINGLE MODE LASERS;

CHARGE CARRIERS; FABRICATION; LASER MODES; MOLECULAR BEAM EPITAXY; OXIDATION; RADIATION DAMAGE; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR DIODES; SEMICONDUCTOR QUANTUM WELLS; STRAIN; THERMAL EFFECTS;

SEMICONDUCTOR LASERS;

EID: 0029714416     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)