MEH-PPV light-emitting diodes: Mechanisms of failure

Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals

Volumn 283, Issue , 1996, Pages 57-62

  Scott, J C ^a   Kaufman, J H ^a   Salem, J ^a   Goitia, J A ^a   Brock, P J ^a   Dipietro, R ^a  

^a IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DEGRADATION; ELECTRON TRANSPORT PROPERTIES; FAILURE (MECHANICAL); FOURIER TRANSFORM INFRARED SPECTROSCOPY; LUMINESCENCE; ORGANIC POLYMERS; SPECTROSCOPY;

HOT SPOTS; SHUNT CURRENT;

LIGHT EMITTING DIODES;

EID: 0029714090     PISSN: 1058725X     EISSN: None     Source Type: Journal    
DOI: 10.1080/10587259608037864     Document Type: Article

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