Future trends in local lifetime control

IEEE International Symposium on Power Semiconductor Devices & ICs (ISPSD)

Volumn , Issue , 1996, Pages 161-165

  Vobecky, J ^a   Hazdra, P ^a  

^a CZECH TECHNICAL UNIVERSITY IN PRAGUE   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

ALPHA PARTICLES; DOSIMETRY; RADIATION HARDENING;

LOCAL LIFETIME CONTROL; POWER DIODES; PROTON IRRADIATION;

POWER ELECTRONICS;

EID: 0029714043     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)