CMOS IC transient radiation effects investigations, model verification and parameter extraction with the test structures laser simulation tests

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 1996, Pages 253-258

  Nikiforov, A Y ^a   Chumakov, A I ^a   Skorobogatov, P K ^a  

^a Specialized Electronic Systems   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; MOSFET DEVICES; PULSED LASER APPLICATIONS; RADIATION EFFECTS; SEMICONDUCTOR DEVICE STRUCTURES; SUBSTRATES;

FUNCTIONAL ELEMENTS; LASER SIMULATION TEST; PARAMETER EXTRACTION; PARASITIC ELEMENTS; PULSED LASER SOURCES;

INTEGRATED CIRCUIT TESTING;

EID: 0029713508     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)