History dependence of non-fully depleted (NFD) digital SOI circuits

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 1996, Pages 122-123

  Assaderaghi, F ^a   Shahidi, G G ^a   Hargrove, M ^a   Hathorn, K ^a   Hovel, H ^a   Kulkarni, S ^a   Rausch, W ^a   Sadana, D ^a   Schepis, D ^a   Schulz, R ^a   Yee, D ^a   Sun, J ^a   Dennard, R ^a   Davari, B ^a  

^a IBM RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; CHARGE CARRIERS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CHARGE; ELECTRIC POWER SUPPLIES TO APPARATUS; ELECTRIC VARIABLES MEASUREMENT; ERRORS; MOSFET DEVICES; PULSE GENERATORS; SHAPE MEMORY EFFECT; SILICON ON INSULATOR TECHNOLOGY; SWITCHING SYSTEMS;

FLOATING BODY; NONFULLY DEPLETED DIGITAL CIRCUITS; PROPAGATION DELAY VARIATIONS; SWITCHING SPEED;

DIGITAL INTEGRATED CIRCUITS;

EID: 0029713421     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)