Novel calibration verification procedure for millimeter-wave measurements

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 1996, Pages 1391-1394

  DuFault, Mark D ^a   Sharma, Arvind K ^a  

^a NORTHROP GRUMMAN CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; MICROSTRIP DEVICES; MILLIMETER WAVES; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; SEMICONDUCTOR DEVICE MODELS; STANDARDS;

ON WAFER CALIBRATION; SHORT, OPEN, LOAD AND THRU (SOLT) CALIBRATION; THRU, REFLECT, LINE (TRL) CALIBRATION;

INTEGRATED CIRCUIT TESTING;

EID: 0029712730     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)