Tight-binding molecular dynamics simulations on point defects diffusion and interactions in crystalline silicon

Materials Research Society Symposium - Proceedings

Volumn 396, Issue , 1996, Pages 33-38

  Tang, M ^a   Colombo, L ^a   Diaz De La Rubia, T ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; CHARACTERIZATION; COMPUTER SIMULATION; CRYSTALLINE MATERIALS; DIFFUSION IN SOLIDS; MATHEMATICAL MODELS; MOLECULAR DYNAMICS; POINT DEFECTS;

ATOMISTIC LEVEL; DEFECT CLUSTERS; DIFFUSION PATH; INTERSTITIAL CLUSTERS; POINT DEFECT DIFFUSION; TIGHT BINDING MOLECULAR DYNAMICS; VACANCY CLUSTERS;

SEMICONDUCTING SILICON;

EID: 0029712372     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)