Serial fault emulation

Proceedings - Design Automation Conference

Volumn , Issue , 1996, Pages 801-806

  Burgun, Luc ^a   Reblewski, Frederic ^a   Fenelon, Gerard ^a   Barbier, Jean ^a   Lepape, Olivier ^a  

^a Meta Systems   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; COMPUTER HARDWARE; COMPUTER SIMULATION; ELECTRIC FAULT LOCATION; INTEGRATED CIRCUIT TESTING; LOGIC DESIGN; LOGIC GATES; MATHEMATICAL MODELS;

HARDWARE EMULATOR; SERIAL FAULT EMULATION (SFE);

SEQUENTIAL CIRCUITS;

EID: 0029712270     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/240518.240669     Document Type: Conference Paper

References (17)