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Volumn , Issue , 1996, Pages 505-513
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Measurement uncertainty models
a
a
Pratt & Whitney
*
(United States)
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Author keywords
[No Author keywords available]
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Indexed keywords
MATHEMATICAL MODELS;
SOCIETIES AND INSTITUTIONS;
STANDARDS;
MEASUREMENT UNCERTAINTY;
RANDOM ERRORS;
MEASUREMENT ERRORS;
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EID: 0029712253
PISSN: 02277576
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (5)
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References (7)
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