Automatic testing of the digital micromirror device (DMD)

LEOS Summer Topical Meeting

Volumn , Issue , 1996, Pages

  Skaggs, Frank ^a   Arakawa, H ^a   Doane, D ^a   Dudasco, D ^a   Streckmann, G ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; CMOS INTEGRATED CIRCUITS; ELECTROOPTICAL EFFECTS; IMAGE PROCESSING; LIGHT; LIGHT SOURCES; MICROELECTROMECHANICAL DEVICES; MIRRORS; OPTICAL TESTING; OPTICS; PERFORMANCE; RANDOM ACCESS STORAGE;

CONTRAST RATIOS; DIGITAL MICROMIRROR DEVICE; MIRROR ARRAY REFLECTION; STATIC RANDOM ACCESS MEMORY; TELEVISION DISPLAYS;

DIGITAL DEVICES;

EID: 0029712221     PISSN: 10994742     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)