Measurement parameter optimization for surface crack detection in metals using an open-ended waveguide probe

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 2, Issue , 1996, Pages 1391-1394

  Zoughi, Reza ^a   Ganchev, Stoyan I ^a   Huber, Christian ^a  

^a Veterinary Dentistry and Oral Surgery   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRACKS; INSPECTION; METALS; OPTIMIZATION; PROBES; RECTANGULAR WAVEGUIDES; SURFACE MEASUREMENT;

MICROWAVE INSPECTION; OPEN ENDED WAVEGUIDE PROBE; SURFACE CRACK DETECTION;

MICROWAVE DEVICES;

EID: 0029711194     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)