Self-driven test structure for pseudorandom testing of non-scan sequential circuits

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1996, Pages 17-25

  Muradali, Fidel ^a   Rajski, Janusz ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CONTROLLABILITY; ERROR DETECTION; FAILURE ANALYSIS; MATHEMATICAL MODELS; OBSERVABILITY; RANDOM PROCESSES; SEQUENTIAL CIRCUITS;

CIRCUIT UNDER TEST; DESIGN FOR TESTABILITY; ON CHIP TEST; PSEUDORANDOM TESTING; SELF DRIVEN TEST; SEQUENTIAL TESTING;

INTEGRATED CIRCUIT TESTING;

EID: 0029709605     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)