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Volumn 45, Issue 1, 1996, Pages 307-310
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Removal Rate and Surface Roughness in High-Precision Lapping of Mn-Zn Ferrite
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Author keywords
Atomic force microscopy (AFM); Lapping; Roughness
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Indexed keywords
ABRASIVES;
ATOMIC FORCE MICROSCOPY;
DIAMOND CUTTING TOOLS;
FERRITES;
MANGANESE COMPOUNDS;
MORPHOLOGY;
POLYCRYSTALLINE MATERIALS;
SCANNING ELECTRON MICROSCOPY;
SURFACE ROUGHNESS;
FIXED DIAMOND GRAINS;
HIGH PRECISION LAPPING;
LAPPING PLATE;
MATERIAL REMOVAL RATE;
LAPPING;
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EID: 0029709132
PISSN: 00078506
EISSN: 17260604
Source Type: Journal
DOI: 10.1016/S0007-8506(07)63069-8 Document Type: Article |
Times cited : (27)
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References (7)
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