Sparse aperture fill for SAR using super-SVA

IEEE National Radar Conference - Proceedings

Volumn , Issue , 1996, Pages 70-75

  Stankwitz, H C ^a   Kosek, M R ^a  

^a ALTARUM INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE DIFFRACTION; ELECTROMAGNETIC WAVE SCATTERING; IMAGE QUALITY; NYQUIST DIAGRAMS; OPTICAL RESOLVING POWER; RADAR IMAGING; RADAR SYSTEMS; SENSOR DATA FUSION; SYSTEMS ANALYSIS;

COHERENT IMAGING PROCESS; NYQUIST SAMPLED SIGNAL DATA; SPARSE APERTURE FILL;

SYNTHETIC APERTURE RADAR;

EID: 0029708752     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)