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Annual Review of Materials Science

Volumn 26, Issue 1, 1996, Pages 693-725

Hard X-ray synchrotron radiation applications in materials science

(3) Knapp, G S a Beno, M A a You, H a

a ARGONNE NATIONAL LABORATORY (United States)

Author keywords

Anomalous scattering; Fine structure; High energy diffraction.; Normal scattering; Powder diffraction; X ray absorption

Indexed keywords

ABSORPTION; DIFFRACTION; INTERFACES (MATERIALS); MATERIALS; SCATTERING; STRUCTURE (COMPOSITION); SURFACES; SYNCHROTRON RADIATION; X RAYS;

ANOMALOUS SCATTERING; FINE STRUCTURE; HARD X RAY SYNCHROTRON RADIATION; HIGH ENERGY DIFFRACTION; NORMAL SCATTERING; POWDER DIFFRACTION;

MATERIALS SCIENCE;

EID: 0029708568 PISSN: 00846600 EISSN: None Source Type: Journal
DOI: 10.1146/annurev.ms.26.080196.003401 Document Type: Article

Times cited : (11)

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