3-D multiphoton laser scanning confocal microscopy as a probe for subsurface defects in polymers

Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

Volumn , Issue , 1996, Pages 19-20

  Bhawalkar, J D ^a   Swiatkiewicz, J J ^a   He, G S ^a   Prasad, P N ^a   Pan, S J ^a   Samarabandu, J K ^a   Liou, W S ^a   Cheng, P C ^a  

^a UNIVERSITY AT BUFFALO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; FLUORESCENCE; FRACTURE; INFRARED RADIATION; LASER MODE LOCKING; LIGHTING; OPTICAL RESOLVING POWER; ORGANIC COMPOUNDS; PHOTONS; POLYMERS; SCANNING; SOLID STATE LASERS;

CONFOCAL LASER SCANNING MICROSCOPY; DIMETHYL SULFOXIDE; FLUOROPHORE; HYDROXYETHYL METHYL AMINO PHENYL HYDROXY SULFONYLSTILBENE; LASER SCANNING FLUORESCENCE MICROSCOPY; PHOTOBLEACHING;

OPTICAL MICROSCOPY;

EID: 0029708556     PISSN: 10928081     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (3)