Development of an optical method for the detection of small quantities of contaminants in SF6

Conference Record of IEEE International Symposium on Electrical Insulation

Volumn 1, Issue , 1996, Pages 114-116

  St Arnaud, J M ^a   Bose, T K ^a   Frechette, M F ^a  

^a UNIVERSITÉ DU QUÉBEC À TROIS RIVIÈRES   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON DIOXIDE; DIELECTRIC PROPERTIES; EXCIMER LASERS; GASES; HYGROMETERS; IMPURITIES; INTERFEROMETERS; INTERFEROMETRY; PRESSURE GAGES; SULFUR COMPOUNDS; THERMODYNAMIC STABILITY;

DIFFERENTIAL INTERFEROMETRIC MEASUREMENT; OPTICAL DIFFERENTIAL METHOD; SULFUR HEXAFLUORIDE;

ELECTRIC INSULATING MATERIALS;

EID: 0029707879     PISSN: 01642006     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)