Write/verify free analog non-volatile memory using a neuron-MOS comparator

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 4, Issue , 1996, Pages 229-232

  Yamashita, Yuichiro ^a   Shibata, Tadashi ^a   Ohmi, Tadahiro ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPARATOR CIRCUITS; ELECTRIC CHARGE; ELECTRODES; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED CIRCUIT TESTING; NEURAL NETWORKS; PATTERN RECOGNITION SYSTEMS; REAL TIME SYSTEMS;

ELECTRON EXTRACTION; FLOATING GATE; REAL TIME EVENT RECOGNITION SYSTEMS; REFERENCE VOLTAGE; TUNNELING ELECTRODE;

PROM;

EID: 0029707651     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)