International comparison of roundness profiles with nanometric accuracy

Metrologia

Volumn 33, Issue 1, 1996, Pages 67-73

  Haitjema, H ^a   Bosse, H ^b   Frennberg, M ^c   Sacconi, A ^d   Thalmann, R ^e  

^a NMi Van Swinden Laboratorium   (Netherlands)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^c Sveriges Provnings och F   (Sweden)

^d Istituto di Metrologia Gustavo Colonnetti   (Italy)

^e Swiss Federal Office of Metrology   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

NANOMETRIC ACCURACY; ROUNDNESS PROFILES; STANDARD DEVIATION;

CORRELATION METHODS; MEASUREMENT ERRORS; SPHERES; STANDARDS; ZIRCONIA;

CONTOUR MEASUREMENT;

EID: 0029707126     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/33/1/9     Document Type: Review

References (6)

1. Sacconi A., Intercomparison of high accuracy roundness measurements, Report EUR 14662 EN, Brussels, Community Bureau of Reference, 1993, 32 p.
2. Sacconi A., Pasin W., An intercomparison of roundness measurements between ten European National Standards Laboratories, Measurement, 1994, 13, 119-128.
3. Sacconi A., Frennberg M., Intercomparison of high accuracy roundness measurements, phase II, to be published, Brussels, 1996.
4. 35-TZP-HIP Mixed Ceramics, manufactured by Sapphirwerk Industrieprodukte AG, CH-2555 Brügg, Switzerland.
5. ISO 4291-1987: Methods for the assessment of departure from roundness, International Organization for Standardization, 1987.
6. Bendat J. S., Piersol A. G., Random Data, 2nd ed., New York, John Wiley & Sons, 1986, 566 p.