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Volumn , Issue , 1996, Pages 139-144
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New method to determine effective channel length, series resistance and threshold voltage
a
a
NEC CORPORATION
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
CALCULATIONS;
CAPACITANCE;
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRIC RESISTANCE MEASUREMENT;
GATES (TRANSISTOR);
OXIDES;
PARAMETER ESTIMATION;
SEMICONDUCTOR DEVICE MODELS;
VOLTAGE MEASUREMENT;
CHANNEL LENGTH;
GATE OXIDES;
SERIES RESISTANCE;
THRESHOLD VOLTAGE;
MOSFET DEVICES;
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EID: 0029707063
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (9)
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References (7)
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