Application of galvanomagnetic measurements in temperature range 70-300 K to MBE GaAs layers characterization

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2780, Issue , 1996, Pages 170-178

  Wolkenberg, Andrzej ^a   Przeslawski, Tomasz ^a  

^a ukasiewicz Research Network Institute of Microelectronics and Photonics   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; HALL EFFECT; MAGNETIC VARIABLES MEASUREMENT; MATHEMATICAL MODELS; MOLECULAR BEAM EPITAXY;

GALVANOMAGNETIC MEASUREMENTS; HALL BARS; HALL MOBILITY; VAN DER PAUW PROBES;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0029705928     PISSN: 0277786X     EISSN: None     Source Type: None    
DOI: 10.1117/12.238149     Document Type: Conference Paper

References (13)