Damage in refractory oxides and ion beam mixing at metal-oxide interfaces induced by GeV ions and 20 MeV cluster beam

Materials Research Society Symposium - Proceedings

Volumn 396, Issue , 1996, Pages 127-135

  Thevenard, P A ^a   Beranger, M ^a   Canut, B ^a   Ramos, S M M ^a  

^a UNIVERSITÉ LYON 1   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; AMORPHIZATION; ATOMS; CRYSTAL DEFECTS; ENERGY DISSIPATION; INTERFACES (MATERIALS); LITHIUM COMPOUNDS; MAGNESIA; NANOSTRUCTURED MATERIALS; RADIATION EFFECTS; SINGLE CRYSTALS; SODIUM;

CLUSTER BOMBARDMENT; ELECTRONIC ENERGY LOSS; ELECTRONIC EXCITATIONS; HEAVY IONS; ION BEAM MIXING;

ION BOMBARDMENT;

EID: 0029705603     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)