|
Volumn , Issue , 1996, Pages 831-836
|
Computing parametric yield adaptively using local linear models
a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
ALGORITHMS;
COMPUTATIONAL COMPLEXITY;
ELECTRIC NETWORK PARAMETERS;
INTEGRATED CIRCUIT LAYOUT;
MATHEMATICAL MODELS;
MONTE CARLO METHODS;
NONLINEAR EQUATIONS;
PRODUCTION CONTROL;
DIVIDE AND CONQUER ALGORITHM;
INTEGRATED CIRCUIT MANUFACTURE;
|
EID: 0029705049
PISSN: 0738100X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1145/240518.240674 Document Type: Conference Paper |
Times cited : (4)
|
References (11)
|