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Volumn , Issue , 1996, Pages 819-824
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Hot-carrier reliability enhancement via input reordering and transistor sizing
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC LOSSES;
ELECTRIC VARIABLES CONTROL;
ELECTROMIGRATION;
FAILURE ANALYSIS;
HOT CARRIERS;
INTEGRATED CIRCUIT LAYOUT;
MATHEMATICAL MODELS;
PROBABILITY;
RELIABILITY;
SWITCHING THEORY;
VLSI CIRCUITS;
ELECTROMIGRATION;
INPUT REORDERING;
TRANSISTOR SIZING;
MOSFET DEVICES;
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EID: 0029705048
PISSN: 0738100X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1145/240518.240672 Document Type: Conference Paper |
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Times cited : (5)
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References (12)
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