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Volumn , Issue , 1996, Pages 479-482
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Fast thermal analysis for CMOS VLSIC reliability
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Author keywords
[No Author keywords available]
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Indexed keywords
CMOS INTEGRATED CIRCUITS;
COMPUTER SIMULATION;
ELECTRIC POWER SUPPLIES TO APPARATUS;
ESTIMATION;
FINITE DIFFERENCE METHOD;
MATRIX ALGEBRA;
SEMICONDUCTOR DEVICE MODELS;
TEMPERATURE DISTRIBUTION;
THERMAL EFFECTS;
THERMOANALYSIS;
THREE DIMENSIONAL;
TIMING CIRCUITS;
CIRCUIT LEVEL ELECTROTHERMAL SIMULATORS;
ELECTRICAL POWER CALCULATION;
FAST THERMAL RELIABILITY DIAGNOSIS TOOL;
FAST TIMING SIMULATOR;
REGION QUADRATIC MODELING TECHNIQUE;
TEMPERATURE DEPENDENT DEVICE MODELS;
THREE DIMENSIONAL ANALYTICAL THERMAL SIMULATOR;
VLSI CIRCUITS;
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EID: 0029703882
PISSN: 08865930
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (3)
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References (6)
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