Multiple fault diagnosis in sequential circuits using sensitizing sequence pairs

Proceedings - Annual International Conference on Fault-Tolerant Computing

Volumn , Issue , 1996, Pages 86-95

  Yanagida, Nobuhiro ^a   Takahashi, Hiroshi ^a   Takamatsu, Yuzo ^a  

^a EHIME UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMBINATORIAL CIRCUITS; CRITICAL PATH ANALYSIS; ELECTRIC NETWORK ANALYSIS; EQUIVALENT CIRCUITS; FAULT TOLERANT COMPUTER SYSTEMS; INTEGRATED CIRCUIT TESTING; LOGIC DESIGN; LSI CIRCUITS;

MULTIPLE FAULT DIAGNOSIS; SENSITIZING SEQUENCE PAIRS;

SEQUENTIAL CIRCUITS;

EID: 0029703834     PISSN: 07313071     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)