|
Volumn , Issue , 1996, Pages 321-324
|
Investigation on the robustness, accuracy and simulation performance of a physics-based deep-submicrometer BSIM model for analog/digital circuit simulation
a a a a a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
COMPUTATIONAL METHODS;
COMPUTER SIMULATION;
DIGITAL CIRCUITS;
INTEGRATED CIRCUIT TESTING;
LINEAR NETWORKS;
MOSFET DEVICES;
PERFORMANCE;
SOLID STATE PHYSICS;
ANALOG DIGITAL CIRCUIT SIMULATION;
BERKELEY SHORT CHANNEL IGFET MODEL;
SEMICONDUCTOR DEVICE MODELS;
|
EID: 0029703539
PISSN: 08865930
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (5)
|
References (10)
|