Test structure advisor and a coupled, library-based test structure layout and testing environment

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 1996, Pages 201-205

  Kumar, Madan V ^a   Plummer, James D ^a   Lukaszek, Wes ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PARAMETRIC TEST SOFTWARE; TEST CHIP DESIGN; TEST STRUCTURE ADVISOR;

COMPUTER SOFTWARE; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; MOSFET DEVICES; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR MATERIALS; USER INTERFACES;

COMPUTER AIDED DESIGN;

EID: 0029703080     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)