Near electric field mapping above X-band MMICs using modulated scattering

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 1996, Pages 1703-1706

  Budka, Thomas P ^a   Waclawik, Scott D ^a   Rebeiz, Gabriel M ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); ELECTRIC FIELD MEASUREMENT; SCHOTTKY BARRIER DIODES; SEMICONDUCTING SILICON; SUBSTRATES;

DISTRIBUTED LOW NOISE AMPLIFIERS; ELECTRIC FIELD INTENSITY; MODULATED SCATTERING SYSTEMS; SILICON SUBSTRATES;

MONOLITHIC MICROWAVE INTEGRATED CIRCUITS;

EID: 0029702083     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)