Contact effects on HF loss of CPW high resistivity silicon lines

IEEE MTT-S International Microwave Symposium Digest

Volumn 1, Issue , 1996, Pages 299-302

  Hu, Z R ^a   Fusco, V F ^a   Wu, Y ^a   Gamble, H G ^a   Armstrong, B M ^a   Stewart, J A C ^a  

^a QUEEN'S UNIVERSITY BELFAST   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTIVITY; SEMICONDUCTING SILICON; SUBSTRATES;

CONTACT EFFECTS; HIGH RESISTIVITY SILICON LINES;

WAVEGUIDE COMPONENTS;

EID: 0029701810     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)