Time resolved spectroscopy of single quantum dot structures

Solid-State Electronics

Volumn 40, Issue 1-8, 1996, Pages 541-544

  Bockelmann, U ^a   Roussignol, Ph ^b   Filoramo, A ^b   Heller, W ^a   Abstreiter, G ^a  

^a WALTER SCHOTTKY INSTITUT   (Germany)

^b ECOLE NORMALE SUPÉRIEURE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; EXCITONS; LASER BEAMS; LIGHT SCATTERING; OPTICAL VARIABLES MEASUREMENT; PHOTOLUMINESCENCE; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR LASERS; SEMICONDUCTOR QUANTUM WELLS; SPECTROSCOPY;

COULOMB SCATTERING; ENERGY RELAXATION PROCESS; LASER INDUCED THERMAL INTERDIFFUSION; LONGITUDINAL OPTICAL PHONON ENERGY; PHOTOLUMINESCENCE MEASUREMENT; TIME RESOLVED SPECTROSCOPY; TWO DIMENSIONAL SYNCHROSCAN STREAK CAMERA;

SEMICONDUCTOR QUANTUM DOTS;

EID: 0029700963     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1101(95)00286-3     Document Type: Article

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