Sinewave fitting procedure for characterizing data acquisition channels in the presence of time base distortion and time jitter

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 2, Issue , 1996, Pages 1419-1424

  Schoukens, J ^a   Pintelon, R ^a   Vandersteen, G ^a  

^a VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; AMPLIFIERS (ELECTRONIC); ANALOG TO DIGITAL CONVERSION; COMMUNICATION CHANNELS (INFORMATION THEORY); DATA ACQUISITION; DYNAMICS; ERROR DETECTION; MATHEMATICAL MODELS; MEASUREMENT ERRORS; NONLINEAR SYSTEMS; SIGNAL DISTORTION; SPURIOUS SIGNAL NOISE;

DATA ACQUISITION CHANNEL; SAMPLE AND HOLD; TIME BASE DISTORTION; TIME JITTER;

CURVE FITTING;

EID: 0029700664     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)