Dynamic diagnosis of sequential circuits based on stuck-at faults

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1996, Pages 198-203

  Venkataraman, Srikanth ^a   Hartanto, Ismed ^a   Fuchs, W Kent ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMBINATORIAL CIRCUITS; COMPUTER SIMULATION; DEFECTS; ERROR DETECTION; FAILURE ANALYSIS; VECTORS;

BENCHMARK CIRCUITS; CAUSE EFFECT ANALYSIS; DYNAMIC DIAGNOSIS; EFFECT CAUSE ANALYSIS; ERROR PROPAGATION BACKTRACE; FAULT DICTIONARY; MATCHING ALGORITHMS; STUCK AT FAULTS; SYNCHRONOUS SEQUENTIAL CIRCUITS;

SEQUENTIAL CIRCUITS;

EID: 0029700387     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)