Dependence of resistivity in evaporated cadmium selenide thin films on preparation conditions and temperature

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2780, Issue , 1996, Pages 80-84

  Oduor, Andrew O ^a   Gould, Robert D ^a  

^a KEELE UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; ELECTRIC RESISTANCE; ELECTRIC RESISTANCE MEASUREMENT; SOLAR CELLS; THIN FILMS; VAPOR DEPOSITION;

CADMIUM SELENIDE; ELECTRON TRAPPING; EVAPORATED THIN FILMS; GRAIN BOUNDARY SCATTERING; LATERAL RESISTIVITY; VAN DER PAUW METHOD;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0029700097     PISSN: 0277786X     EISSN: None     Source Type: None    
DOI: 10.1117/12.238128     Document Type: Conference Paper

References (25)