Heteroepitaxy of CdTe on Si substrates in view of infrared and x-ray detection

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2685, Issue , 1996, Pages 28-40

  Faurie, Jean Pierre ^a   Almeida, L A ^a   Chen, Yuanping ^a   Sporken, R ^a   Sivananthan, Sivalingam ^a  

^a UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MOLECULAR BEAM EPITAXY; PHOTOELECTRON SPECTROSCOPY; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING SILICON; SUBSTRATES; SYNCHROTRON RADIATION; X RAY APPARATUS;

CADMIUM TELLURIDE; EPILAYERS; HETEROEPITAXY;

INFRARED DETECTORS;

EID: 0029699844     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.237710     Document Type: Conference Paper

References (35)