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Volumn , Issue , 1996, Pages 1211-1216

Thermal fatigue reliability enhancement of plastic ball grid array (PBGA) packages

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN; FATIGUE TESTING; MATHEMATICAL MODELS; NUMERICAL ANALYSIS; PLASTICS APPLICATIONS; PRINTED CIRCUIT BOARDS; RELIABILITY; SOLDERED JOINTS; SURFACE MOUNT TECHNOLOGY; THERMAL CYCLING;

EID: 0029699475     PISSN: 05695503     EISSN: None     Source Type: None    
DOI: 10.1109/ECTC.1996.550889     Document Type: Article
Times cited : (44)

References (10)
  • 1
    • 0011998874 scopus 로고
    • BGA Solder Joint Reliability Study for Automotive Electronics
    • T. R. Lindley BGA Solder Joint Reliability Study for Automotive Electronics Proceedings, 1995 International Conference on Multichip Modules 126 133 Proceedings, 1995 International Conference on Multichip Modules 1995
    • (1995) , pp. 126-133
    • Lindley, T.R.1
  • 3
    • 0003726306 scopus 로고
    • Designed Experiment to Determine Attachment Reliability Drivers for PBGA Packages
    • T. I. Ejim A. Holliday Designed Experiment to Determine Attachment Reliability Drivers for PBGA Packages Proceedings, Surface Mount International 385 392 Proceedings, Surface Mount International 1995
    • (1995) , pp. 385-392
    • Ejim, T.I.1    Holliday, A.2
  • 4
    • 0343045573 scopus 로고
    • Fatigue Life Comparison of Perimeter and Full Plastic Ball Grid Array (PBGA)
    • C. Ramirez S. Fauser Fatigue Life Comparison of Perimeter and Full Plastic Ball Grid Array (PBGA) Proceedings, Surface Mount International Proceedings, Surface Mount International 1994
    • (1994)
    • Ramirez, C.1    Fauser, S.2
  • 5
    • 0029326177 scopus 로고
    • Creep Crack Growth Prediction of Solder Joints During Temperature Cycling - An Engineering Approach
    • A. R. Syed Creep Crack Growth Prediction of Solder Joints During Temperature Cycling-An Engineering Approach ASME Journal of Electronic Packaging 117 116 122 June 1995
    • (1995) ASME Journal of Electronic Packaging , vol.117 , pp. 116-122
    • Syed, A.R.1
  • 6
    • 85176673755 scopus 로고
    • Effect of Temperature Profile Parameters on Creep Strain Response of Solder Joints in Leaded Surface Mount Devices
    • A. R. Syed B., K. Banerjee P. K. Bhatti K Gschwend A. Y. Kwang Effect of Temperature Profile Parameters on Creep Strain Response of Solder Joints in Leaded Surface Mount Devices Proceedings, 1993 ASME International Electronic Packaging Conference 2 1055 1062 Proceedings, 1993 ASME International Electronic Packaging Conference 1993
    • (1993) , vol.2 , pp. 1055-1062
    • Syed, A.R.1    Banerjee, B..K.2    Bhatti, P.K.3    Gschwend, K4    Kwang, A.Y.5
  • 7
    • 0001197676 scopus 로고
    • Fatigue of Solder Joints in Surface Mount Devices
    • M. C. Shine L. R. Fox Fatigue of Solder Joints in Surface Mount Devices ASTM STP 942, Low Cycle Fatigue 588 610 ASTM STP 942, Low Cycle Fatigue Philadelphia 1988
    • (1988) , pp. 588-610
    • Shine, M.C.1    Fox, L.R.2
  • 8
    • 0004006845 scopus 로고
    • Cooling Techniques for Electronic Equipment
    • John Wiley
    • D. S. Steinberg Cooling Techniques for Electronic Equipment 304 305 1991 John Wiley
    • (1991) , pp. 304-305
    • Steinberg, D.S.1
  • 10
    • 0024070078 scopus 로고
    • A Creep-Rupture Model for Two-Phase Eutectic Solders
    • B Wong D. E Helling R. W Clark A Creep-Rupture Model for Two-Phase Eutectic Solders IEEE CHMT 11 3 284 290 1988
    • (1988) IEEE CHMT , vol.11 , Issue.3 , pp. 284-290
    • Wong, B1    Helling, D.E2    Clark, R.W3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.