Novel built-in current sensor for IDDQ testing of deep submicron CMOS ICs

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1996, Pages 118-123

  Athan, Stephan P ^a   Landis, David L ^a   Al Arian, Sami A ^a  

^a UNIVERSITY OF SOUTH FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENT DISTRIBUTION; ELECTRIC CURRENT MEASUREMENT; ERROR DETECTION; LEAKAGE CURRENTS; SENSORS; ULSI CIRCUITS;

BUILT-IN CURRENT SENSOR; DEEP SUBMICRON DEVICES; FAULT DETECTABILITY; FAULT DIAGNOSABILITY; FAULT DIAGNOSIS; TEST PATTERN GENERATION;

INTEGRATED CIRCUIT TESTING;

EID: 0029698339     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)