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Volumn 26, Issue 1, 1996, Pages 223-277

On the design, analysis, and characterization of materials using computational neural networks

Author keywords

Materials and system engineering; Materials modeling and design; Process control and fault diagnosis; Quantitative structure activity property relationships; Sensor and data fusion; Spectroscopy

Indexed keywords

DESIGN; FAILURE ANALYSIS; MATERIALS SCIENCE; MATERIALS TESTING; OPTIMIZATION; PATTERN RECOGNITION; PROCESS CONTROL; SENSOR DATA FUSION; SPECTROSCOPY; SYSTEMS ENGINEERING;

EID: 0029698266     PISSN: 00846600     EISSN: None     Source Type: Journal    
DOI: 10.1146/annurev.ms.26.080196.001255     Document Type: Article
Times cited : (76)

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    • IEEE sponsors a number of relevant meetings, such as IEEE Conference on Control Applications; IEEE Instrumentation and Measurement Technology Conference; IEEE Conference on Decision and Control; IEEE Internatiaonal Conference on Systems, Man, and Cybernetics; IEEE/IAS International Conference on Industrial Automation and Control; IEEE Annual Textile, Fiber & Film Industry Technical Conference; IEEE International Conference on Industrial Technology; IEEE Workshop on Neural Netw. for Signal Processing; IEEE International Conference on Neural Netw., New York: IEEE Press
    • IEEE sponsors a number of relevant meetings, such as IEEE Conference on Control Applications; IEEE Instrumentation and Measurement Technology Conference; IEEE Conference on Decision and Control; IEEE Internatiaonal Conference on Systems, Man, and Cybernetics; IEEE/IAS International Conference on Industrial Automation and Control; IEEE Annual Textile, Fiber & Film Industry Technical Conference; IEEE International Conference on Industrial Technology; IEEE Workshop on Neural Netw. for Signal Processing; IEEE International Conference on Neural Netw., New York: IEEE Press
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    • For relevant meetings, see Am. Control Conf.
    • For relevant meetings, see Am. Control Conf.
  • 356
    • 85033018443 scopus 로고    scopus 로고
    • For relevant meetings, see Int. Conf. Ind. Eng. Appl. Artif. Intel. Expert Syst.
    • For relevant meetings, see Int. Conf. Ind. Eng. Appl. Artif. Intel. Expert Syst.
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    • For relevant meetings, see Int. Conf. Intel. Syst. Process Eng.
    • For relevant meetings, see Int. Conf. Intel. Syst. Process Eng.
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    • For relevant meetings, see World Congr. Neural Netw. INNS
    • For relevant meetings, see World Congr. Neural Netw. INNS


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.