iCET: A complete chip-level thermal reliability diagnosis tool for CMOS VLSI chips

Proceedings - Design Automation Conference

Volumn , Issue , 1996, Pages 548-551

  Cheng, Yi Kan ^a   Teng, Chin Chi ^a   Dharchoudhury, Abhijit ^a   Rosenbaum, Elyse ^a   Kang, Sung Mo ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER AIDED NETWORK ANALYSIS; COMPUTER SIMULATION; RELIABILITY; THERMODYNAMIC PROPERTIES; VLSI CIRCUITS;

ICET ELECTROTHERMAL SIMULATOR;

INTEGRATED CIRCUIT TESTING;

EID: 0029698052     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)