PLZT-based multilayer composite thin films, Part II: Modeling of the dielectric and hysteresis properties

Ferroelectrics

Volumn 177, Issue 3-4, 1996, Pages 237-253

  Dausch, D E ^a,b   Furman, E ^a   Wang, F ^a,c   Haertling, G H ^a  

^a CLEMSON UNIVERSITY   (United States)

^b NASA LANGLEY RESEARCH CENTER   (United States)

^c NZ Applied Technologies   (United States)

Author keywords

Dielectric properties; Hysteresis model; Multilayer composites; Series capacitors; Thin films

Indexed keywords

CAPACITORS; CHARACTERIZATION; COMPOSITE MATERIALS; COMPOSITION; CRYSTAL STRUCTURE; DIELECTRIC PROPERTIES; HYSTERESIS; LEAD COMPOUNDS; MATHEMATICAL MODELS; MULTILAYERS; PERMITTIVITY; PHASE TRANSITIONS;

COMPOSITE FILM STRUCTURE; FERROELECTRIC HIGH FIELD SWITCHING PROPERTIES; HYSTERESIS MODEL; LEAD LANTHANUM ZIRCONIUM TITANATE; MULTILAYER COMPOSITES; NON UNIFORM ELECTRIC FIELD DISTRIBUTIONS; NONLINEAR POLARIZABILITIES; SERIES CAPACITORS;

THIN FILMS;

EID: 0029697082     PISSN: 00150193     EISSN: None     Source Type: Journal    
DOI: 10.1080/00150199608223632     Document Type: Article

References (8)

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