New probing system for the in-circuit test of a PCB

Proceedings - IEEE International Conference on Robotics and Automation

Volumn 1, Issue , 1996, Pages 590-595

  Shim, J H ^a   Cho, H S ^a   Kim, S ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ACTUATORS; ALGORITHMS; END EFFECTORS; FEEDBACK CONTROL; FORCE CONTROL; PRINTED CIRCUIT BOARDS; PRINTED CIRCUIT TESTING; PROBES;

CONTACT FORCE; CONTACT MOTIONS; IN CIRCUIT TEST; MACROACTUATORS; MICROACTUATORS; ROBOTIC PROBING DEVICES;

INDUSTRIAL ROBOTS;

EID: 0029695015     PISSN: 10504729     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)