Time-resolved in situ and real time study of an electrode process by differential X-ray diffraction: Ag underpotential deposition on Au(111)

Journal of Electroanalytical Chemistry

Volumn 401, Issue 1-2, 1996, Pages 257-261

  Chabala, E D ^a   Rayment, T ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Adlayer; Electrochemistry; Interface; UPD systems

Indexed keywords

ADSORPTION; DEPOSITION; ELECTROCHEMICAL ELECTRODES; GOLD; INTERFACES (MATERIALS); PHASE TRANSITIONS; SILVER; SURFACE STRUCTURE; THICKNESS CONTROL; THIN FILMS;

ADLAYERS; BRAGG PEAK MODIFICATION; SURFACE DIFFERENTIAL DIFFRACTION; UNDERPOTENTIAL DEPOSITION;

X RAY DIFFRACTION;

EID: 0029694743     PISSN: 15726657     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-0728(95)04415-9     Document Type: Article

References (17)

1. M. Fleischmann and B.W. Mao, J. Electroanal. Chem., 229 (1987) 125; 247 (1988) 297.
2. M. Fleischmann and B.W. Mao, J. Electroanal. Chem., 229 (1987) 125; 247 (1988) 297.
3. H.D. Abruña, Electrochemical Interfaces: Modern Techniques for In-situ Interface Characterisation, VCH, 1991.
4. H.D. Dewald, Electroanalysis, 145 (1991) 3; M.F. Toney, G.J. Gordon, M.G. Samant, G.L. Borges, O.R. Melroy, D. Yee and L.B. Sorensen, Phys. Rev. B, 45 (1992) 9362.
5. H.D. Dewald, Electroanalysis, 145 (1991) 3; M.F. Toney, G.J. Gordon, M.G. Samant, G.L. Borges, O.R. Melroy, D. Yee and L.B. Sorensen, Phys. Rev. B, 45 (1992) 9362.
6. B.C. Bravo, S.L. Michelhaugh, M.P. Soriaga, I. Vilegas, D.W. Suggs and J.L. Stickney, J. Phys. Chem., 95 (1991) 5245.
7. D.M. Kolb, Adv. Electrochem. Electrochem. Eng., 11 (1978) 125; W.J. Lorenz, H.D. Hermann, N. Wuthrich and F. Hilbert, J. Electrochem. Soc., 121 (1974) 1167.
8. D.M. Kolb, Adv. Electrochem. Electrochem. Eng., 11 (1978) 125; W.J. Lorenz, H.D. Hermann, N. Wuthrich and F. Hilbert, J. Electrochem. Soc., 121 (1974) 1167.
9. (a) T. Hachiya and K. Itaya, Ultramicroscopy, 42-44 (1992) 445;
10. (b) S. Manne, P.K. Hansma, J. Massie, V.B. Elings and A.A. Gewirth, Science, 251 (1991) 183.
11. J.P. Beaufils and Y. Barbaux, J. Appl. Cryst., 15 (1982) 301; T. Rayment; R. K. Thomas, G. Bonchil and J. H. White, Mol. Phys., 43 (1981) 601.
12. J.P. Beaufils and Y. Barbaux, J. Appl. Cryst., 15 (1982) 301; T. Rayment; R. K. Thomas, G. Bonchil and J. H. White, Mol. Phys., 43 (1981) 601.
13. E.D. Chabala, H.H. Bashir, T. Rayment and M.D. Archer, Langmuir, 8 (1992) 2028.
14. C.-H. Chen, S.M. Vesecky and A.A. Gewirth, J. Am. Chem. Soc., 114 (1992) 451.
15. S.C. Corcoran, G.S. Chakarova and K. Sieradzki, J. Electroanal. Chem., 377 (1994) 85.
16. E. Budevski, K. Juttner, W.J. Lorenz and G. Staikov, Electrochim. Acta, 39 (1994) 1019.
17. E.D. Chabala and T. Rayment, in preparation.