Simple analytical model of bias dependence of the photocurrent of metal–semiconductor–metal photodetectors

Applied Optics

Volumn 35, Issue 1, 1996, Pages 15-23

  Liou, Liann Chern ^a   Nabet, Bahram ^a  

^a Drexel University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; CAPACITANCE; CHARGE CARRIERS; CURRENT DENSITY; CURRENT VOLTAGE CHARACTERISTICS; DIFFUSION; ELECTRODES; MATHEMATICAL MODELS;

BIAS DEPENDENCE; CARRIER DRIFTS; DIFFUSION EQUATION; METAL SEMICONDUCTOR METAL PHOTODETECTORS;

PHOTODETECTORS;

EID: 0029679012     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.000015     Document Type: Article

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