Incoherent transmissivity and reflectivity of an absorbing–plane plate or layer with linear variations in thickness

Applied Optics

Volumn 35, Issue 1, 1996, Pages 113-116

  Kushev, D B ^a   Zheleva, N N ^a  

^a UNIVERSITY OF SOFIA   (Bulgaria)

Author keywords

Plane nonparallel film; Reflectivity; Transmittivity

Indexed keywords

CALCULATIONS; INFRARED SPECTROSCOPY; LIGHT REFLECTION; LIGHT TRANSMISSION; NATURAL FREQUENCIES; PERMITTIVITY; REFRACTIVE INDEX; SEMICONDUCTING INDIUM COMPOUNDS;

INCIDENCE ANGLE; INCOHERENCE; REFLECTIVITY; TRANSMISSIVITY;

OPTICAL FILMS;

EID: 0029678980     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.000113     Document Type: Article

References (4)

1. D. B. Kushev, “Influence of finite spectral width on the interference spectra of a thin absorbing film on a transparent substrate,” Infrared Phys. Technol. (to be published).
2. D. B. Kushev and N. N. Zheleva, “Transmittivity, reflectivities and absorptivities of semiconductor film with linear variation in thickness,” J. Phys. D 28, 1239-1243 (1995).
3. D. Siapkas, D. B. Kushev, N. N. Zheleva, J. Siapkas, and I. Lelidis, “Optical constants of tin telluride determined from infrared interference spectra,” Infrared Phys. 31, 425-433 (1991).
4. E. E. Bell, “Optical constants and their measurements,” in Encyclopedia of Physics, S. Flügge, ed. (Springer-Verlag, Berlin, 1967), Vol. 25, Part 2a, pp. 1-58.